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IOP Science

Measurement Science and Technology

About Measurement Science and Technology


Measurement Science and Technology™ publishes articles on new measurement techniques and associated instrumentation. Papers that describe experiments must represent an advance in measurement science or measurement technique rather than the application of established experimental technique. Bearing in mind the multidisciplinary nature of the journal, authors must provide an introduction to their work that makes clear the novelty, significance, broader relevance of their work in a measurement context and relevance to the readership of Measurement Science and Technology. All submitted articles should contain consideration of the uncertainty, precision and/or accuracy of the measurements presented.

Subject coverage includes the theory, practice and application of measurement in physics, chemistry, engineering and the environmental and life sciences from inception to commercial exploitation. Publications in the journal should emphasize the novelty of reported methods, characterize them and demonstrate their performance using examples or applications.

Full list of subject sections:

  • Precision measurements and metrology: dimensional, optical, thermal, acoustic and electrical metrology (from pico- and nano-scale to macro-scale); new measurement principles; signal processing techniques; theory of measurement; calibrations.
  • Sensors and sensor systems: based on physical, chemical or biological principles; micro- and nano-scale systems; sensors for physical, chemical and biological quantities.
  • Optical and laser based techniques: fibre optics; interferometry; quantum information and related techniques: methods or instruments that rely on the light-/laser- matter interaction to infer various physical quantities.  
  • Fluids: fluid flow; velocimetry; particle sizing, etc., including microfluidic measurements.
  • Imaging: Micro/nanoscopic, radiographic, interferometric, acoustic, ultrasonic, magnetic, THz, microwave, lidar & radar, and 3D imaging.
  • Spectroscopy: including but not limited to spectrometry; electromagnetic, optical, acoustic and mechanical spectroscopy.
  • Materials and materials processing: non-destructive testing and evaluation, structural health monitoring, non-contact measurements, embedded and surface measurement devices and mechanical state sensors. 
  • Biological, medical and life science: imaging and spectroscopic techniques, biosensors and related techniques.
  • Environmental and atmospheric: hydrological sensing, physical parameters of air and water, air and water quality sensing, gas exchange sensing, etc.
  • Novel instrumentation systems and components: equipment or techniques that advance the science and technology of measurement.
  • Advanced measurement tools: application of machine learning, artificial intelligence, neural networks, digital twinning and digitalisation to measurement science.
  • Signal processing: identification of components of interest in a measured signal; analyzing, modifying and synthesizing signals to optimise information transmission and storage.
  • Control and automation: Fault diagnosis; condition-based maintenance; process control; decision science.
  • Positioning and navigation: Global Navigation Satellite Systems (GNSS); geodesy; inertial navigation; indoor navigation; satellite measurement techniques; detection and ranging techniques.


There is a close relationship and cooperation between the two IOP Publishing journals, Measurement Science and Technology and Metrologia.  Both journals publish articles about metrology. Together they cover the whole measurement chain from realisation of the SI to wider dissemination and application in industrial and academic environments.

Metrologia publishes work on the foundations of measurement, measurements improving our knowledge of the fundamental constants, realisations of the units of the International System of Units (SI), the solution of difficult measurement problems, measurements expanding the range or reducing the uncertainty compared to existing state-of-the-art, data analysis and the expression of uncertainty.

Why should you publish in Measurement Science and Technology?

  • It is the world’s first scientific instrumentation and measurement journal: launched in 1923 as the Journal of Scientific Instruments and has always published leading edge work in this important area for science and technology.
  • Multidisciplinary audience: through its broad focus, Measurement Science and Technology aims to serve all communities engaged with instrumentation development and the science of measurement. Although having several specialist themes, the journal addresses many generic aspects of measurement science and is a fertile ground exchange of ideas and knowledge. There is a focus both on traditional and on emerging areas of high interest to academic and industrial sectors. For many scientists and engineers specialising in instrumentation and measurement, Measurement Science and Technology is a journal of choice. The editorial board also encourages articles from others for whom reporting instrumentation and measurement activities may not be their main focus of their activities but nevertheless they have valuable contributions worthy of publication.
  • High standards: Measurement Science and Technology has a selective editorial policy to ensure publication of only the highest quality research in terms of significance, originality and scientific rigour. All articles are rigorously peer reviewed by IOP Publishing’s global network of expert reviewers, supported by our Editorial Board.
  • Fast publication: We are committed to providing you with a fast, professional service to ensure rapid first decision, acceptance and publication. Once accepted, your article will be accessible to readers within 24 hours (with a citable DOI).
  • Strong links with national metrology laboratories: Measurement Science and Technology is a popular place of publication of applied metrology from National Measurement Institutes with representation from many NMIs on the editorial board. **
  • Preprint friendly: You are welcome to share a preprint of your work on community preprint platforms.
  • Society owned: IOP Publishing is a leading society publisher in the physical sciences. Any profits generated are invested in the Institute of Physics, helping to support science research, education and outreach around the world.

Article types

Measurement Science and Technology welcomes submissions of the following article types:

  • Papers: reports of high-quality original research with conclusions representing a significant advance in the field.
  • Technical design notes: brief contributions serving a useful purpose to readers. Not normally more than 2500 words (three journal pages). Articles should include descriptions of apparatus or techniques developed for a specific purpose and novel, non-trivial technical solutions to commonly encountered problems.
  • Special issue articles: invited articles, which will form a special collection of papers on a specific theme. When asked to select ‘Article Type’ on the submission system, please select ‘Special Issue Article’. Then select the special issue you’re submitting to in the drop down box that appears.
  • Topical Reviews: written by leading researchers in their fields, topics should be within scope of the journal, details of which can be found here. A review should give a critical overview including background information, the relevance and importance of the topic, the current state of the art and discussion of the future direction of research in the field. Articles are normally written upon invitation by the Editorial Board. In some special cases, an unsolicited review will be considered; however, authors should contact the Reviews’ Editor prior to submission.

Special requirements

Please note that all submissions to Measurement Science and Technology require a statement (in under 100 words) detailing the novelty, significance and broader relevance of your work in a measurement context.

Our policy on conference material submitted to Measurement Science and Technology:

Measurement Science and Technology will not consider the same research already published in a well-known conference proceedings publication and which is readily accessible to the community. Submitted manuscripts should contain substantially more research and analysis than the original conference paper published by the same authors. Upon submission, we ask authors to declare all their previously published conference papers that are similar in content to any submission made to the journal.

Measurement Science and Technology’s statement regarding the inclusion of potentially offensive or inappropriate imagery in submitted papers:

We ask authors to carefully consider both the subject matter and provenance of images included in their work before submitting to the journal. If the submitted images could be potentially offensive to the journal’s readership or violate copyright, Measurement Science and Technology reserves the right to request that authors seek alternative images or other means to express the same results before the final version is published.

Peer review

The following summary describes the peer review process for Measurement Science and Technology, using the ANSI/NISO Standard Terminology for Peer Review:

  • Identity transparency: single-anonymous, double-anonymous (author choice)
  • Reviewer interacts with: Editor
  • Review information published: review reports (author and reviewer opt in), author/editor communication, reviewer identities (reviewer opt in)

Our Publishing Support website provides more information on our reviewing process as well as checklists in both English and Chinese language to help authors prepare their manuscripts for submission.

If an article is not accepted for publication, we may offer the author the opportunity to transfer their submission to other suitable journals we publish.

Inclusivity and diversity

IOP Publishing recognises that there are inequalities within the scientific publishing and research ecosystems. We are committed to a progressive approach to inclusivity and diversity, and are working hard to eliminate discrimination to foster an equitable and welcoming publishing environment for all.

IOP Publishing follows Guidelines on Inclusive Language and Images in Scholarly Communication to ensure that journal articles use bias-free and culturally sensitive communication. We ask authors to please follow these guidelines in their manuscript submissions.

More information about our work on inclusivity is available on our Open Physics hub.


Measurement Science and Technology maintains the highest standards of publication and research ethics and is a member of the Committee for Publication Ethics (COPE). Authors are expected to comply with IOP Publishing’s Ethical Policy.

Research data

Measurement Science and Technology has adopted IOP Publishing’s research data policy. Please check that your article complies with the policy before submission.

Please note that this policy requires authors to include a data availability statement in their article.

For any questions about the policy please contact the journal.

Many research funders now require authors to make all data related to their research available in an online repository. Please refer to the policy for further information about research data, data repositories and data citation.

Open access

Measurement Science and Technology is a hybrid open access journal. Authors have the option to pay an article publication charge (APC) to publish their article on a gold open access basis under a Creative Commons Attribution (CC BY) licence. Articles published on a gold open access basis are freely available to everyone to read and reuse immediately upon publication, provided the terms of the licence are followed and clear attribution to the author is given.

Alternatively authors who do not select the gold open access option can choose a green open access route to publication.

For more information on IOP Publishing’s open access policies please see our Open access page. For our author rights policies please see our Author rights page.

Publication charges

Publication on a subscription-access basis is free of charge.

Authors have the option to pay the following article publication charge (APC) to publish their article on an open access basis under a Creative Commons Attribution (CC BY) licence.

Article publication charge* £2295 €2635 $3165
Reduced article publication charge* for Group B countries** £500 €575 $675
Reduced article publication charge for Group A countries** £0 €0 $0

*excluding VAT where applicable

**eligibility criteria can be found here

APCs only apply to articles accepted for publication; there are no submission charges.

There are no other charges for publishing in Measurement Science and Technology.

Transformative Agreements

Measurement Science and Technology is included in our transformative agreements which allow authors from some institutions to publish open access without paying an APC.

Find out if you’re covered by an agreement

If you are covered by an agreement, use our author guide to help you submit your paper.

Countries where we have transformative agreements include:
Austria, Canada, Croatia, Finland, Hungary, Ireland, Israel, Germany, Poland, The Netherlands, United Kingdom, Saudi Arabia, Slovenia, Sweden and Switzerland.

Paying for open access

Various discounts, waivers and funding arrangements are available to support our authors. Visit our Paying for open access page for further details.


Abstracting and indexing services

We work with our authors to help make their work as easy to discover as possible. Measurement Science and Technology is currently included in the following abstracting and discovery services:

  • Chemical Abstracts Service
  • CNKI Scholar
  • EBSCO Applied Science & Technology Abstracts
  • EBSCO Applied Science & Technology Source
  • EBSCO Applied Science & Technology Source Ultimate
  • EBSCO Applied Science and Technology Index
  • EBSCO Book Review Digest Plus
  • EBSCO Computers & Applied Sciences Complete
  • EBSCO Engineering Collection: India
  • EBSCO Engineering Source
  • EBSCO Environmental Engineering Collection: India
  • EBSCO STM Source
  • EBSCO TOC Premier
  • Ei Compendex
  • GeoRef
  • INIS (International Nuclear Information System)
  • Inspec
  • NASA Astrophysics Data System
  • Scopus
  • VINITI Abstracts Journal (Referativnyi Zhurnal)
  • Web of Science (Science Citation Index, Science Citation Index Expanded, Current Contents Physical, Chemical and Earth Sciences, Current Contents Engineering, Computing and Technology)
  • Yewno Unearth

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