Editorial board

Editor-in-Chief

Andrew Yacoot National Physical Laboratory, Teddington, UK. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems; Imaging; Novel instrumentation systems and components.

Commissioning Board

Weiwei Cai Shanghai Jiao Tong University, China. Subject sections of interest: Optical and laser based techniques; Imaging; Spectroscopy; Advanced measurement tools.

Stefano Discetti Universidad Carlos III de Madrid, Spain. Subject sections of interest: Optical and laser based techniques; Fluids; Imaging.

François Hild University Paris-Saclay, France. Subject sections of interest: Precision measurements and metrology; Imaging; Materials and materials processing; Advanced measurement tools.

Dimitris Iakovidis University of Thessaly, Greece. Subject sections of interest: Imaging; Biological, medical and life sciences; Advanced measurement tools; Signal processing.

B Jakoby Johannes Kepler University Linz, Austria. Subject sections of interest: Sensors and sensor systems; Optical and laser based techniques; Fluids; Materials and materials processing; Biological, medical and life science.

Jung-Ryul Lee Korea Advanced Institute of Science and Technology, Daejeon, Korea. Subject sections of interest: Sensors and sensor systems; Optical and laser based techniques; Materials and materials processing; Advanced measurement tools.

Jinjin Li National Institute of Metrology, Beijing, China. Subject sections of interest: Precision measurements and metrology; Optical and laser based techniques.

Scott C Morris University of Notre Dame, IN, USA. Subject sections of interest: Sensors and sensor systems; Fluids; Imaging; Novel instrumentation systems and components.

Ravibabu Mulaveesala Indian Insitutute of Technology Delhi, India. Subject sections of interest: Imaging; Materials and materials processing; Biological, medical and life science.

Eric R Pardyjak University of Utah, Salt Lake City, USA. Subject sections of interest: Sensors and sensor systems; Fluids; Environmental and atmospheric; Novel instrumentation systems and components.

Jacek D Paziewski University of Warmia and Mazury in Olsztyn, Poland. Subject sections of interest: Precision measurement and metrology; Environmental and atmospheric; Positioning and navigation.

Brian Simonds National Institute of Standards and Technology, Boulder, CO, USA. Subject sections of interest: Optical and laser based techniques; Materials and materials processing.

Hongki Yoo Korea Advanced Institute of Science and Technology, Daejeon, Korea. Subject sections of interest: Precision measurement and metrology; Optical and laser based techniques; Imaging; Biological, medical and life science.

Peer-Review Board

Mohd Zaid Abdullah Universiti Sains Malaysia. Subject sections of interest: Imaging; Materials and materials processing; Biological, medical and life science.

Harald Bosse Physikalisch-Technische Bundesanstalt, Braunschweig, Germany. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems; Optical and laser based techniques; Imaging; Novel instrumentation systems and components.

Miryan Cassanello University of Buenos Aires, Argentina. Subject sections of interest: Fluids; Environmental and atmospheric.

Antonella D’Alessandro Università degli Studi di Perugia, Italy. Subject sections of interest: Sensors and sensor systems; Materials and materials processing; Novel instrumentation systems and components; Control and automation.

Marco J da Silva Johannes Kepler University Linz, Austria. Subject sections of interest: Sensors and sensor systems; Fluids; Imaging; Signal processing.

Jianghui Geng Wuhan University, Wuhan, China. Subject sections of interest: Sensors and sensor systems; Environmental and atmospheric; Positioning and navigation.

Teodor Gotszalk Wrocław University of Science and Technology, Poland. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems.

Hajime Inaba National Metrology Institute of Japan, Tsukuba, Japan. Subject sections of interest: Precision measurements and metrology; Optical and laser based techniques; Spectroscopy.

Kyung Chun Kim Busan National University, Korea. Subject sections of interest: Optical and laser based techniques; Fluids; Imaging.

Simon Laflamme Iowa State University, Ames, USA. Subject sections of interest: Sensors and sensor systems; Materials and materials processing; Control and automation.

Zengke Li China University of Mining and Technology, China. Subject sections of interest: Signal processing; Positioning and navigation.

Xiang Li Xi’an Jiaotong University, China. Subject sections of interest: Precision measurements and metrology; Materials and materials processing; Advanced measurement tools; Control and automation.

Xihui (Larry) Liang University of Manitoba, Canada. Subject sections of interest: Materials and materials processing; Advanced measurement tools; Signal processing; Control and automation.

Hélène Mainaud Durand CERN, Switzerland. Subject sections of interest: Precision measurements and metrology; Optical and laser based techniques; Advanced measurement tools; Positioning and navigation.

Subhas Mukhopadhyay Macquarie University, Australia. Subject sections of interest: Sensors and sensor systems; Materials and materials processing; Biological, medical and life science; Novel instrumentation systems and components.

John M Myers Harvard University, Cambridge, MA, USA. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems; Optical and laser based techniques; Novel instrumentation systems and components.

Yujiro Naruse Japan Science and Technology Agency, Tokyo, Japan. Subject sections of interest: Sensors and sensor systems; Imaging; Biological, Novel instrumentation systems and components.

Bing Pan Beihang University, Beijing, China. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems; Optical and laser based techniques.

Gokul Pathikonda Arizona State University, USA. Subject sections of interest: Optical and laser based techniques; Fluids.

Seetha Raghavan Embry-Riddle Aeronautical University, Florida, USA. Subject sections of interest: Precision measurements and metrology; Optical and laser based techniques; Materials and materials processing; Novel instrumentation systems and components.

Sebastian Reinecke Helmholtz-Zentrum Dresden-Rossendorf, Germany. Subject sections of interest: Sensors and sensor systems; Fluids; Environmental and atmospheric.

Jose Luis Santos University of Porto, Portugal. Subject sections of interest: Sensors and sensor systems; Optical and laser based techniques.

Yohei Sato Keio University, Yokohama, Japan. Subject sections of interest: Optical and laser based techniques; Fluids; Biological, medical and life science.

Andrea Sciacchitano Delft University of Technology, The Netherlands. Subject sections of interest: Optical and laser based techniques; Fluids.

Haidong Shao Hunan University, China. Subject sections of interest: Advanced measurement tools; Signal processing; Control and automation.

Chuji Wang Mississippi State University, Starkville, USA. Subject sections of interest: Optical and laser based techniques; Spectroscopy; Biological, medical and life science.

Lijun Xu Beihang University, Beijing, China. Subject sections of interest: Optical and laser based techniques; Fluids; Imaging; Spectroscopy.

Yoshi Yamada National Physical Laboratory, Teddington, UK. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems; Novel instrumentation systems and components.

Wuqiang Yang University of Manchester, UK. Subject sections of interest: Sensors and sensor systems; Fluids; Imaging; Novel instrumentation systems and components.

Jiamin Ye Tianjin University, China. Subject sections of interest: Sensors and sensor systems; Fluids; Imaging; Signal processing.

Hongmei Zhang Xi’an Jiaotong University, China. Subject sections of interest: Precision measurements and metrology; Imaging; Biological, medical and life science; Advanced measurement tools.

Weibin Zhu ILJIN USA Corporation, MI, USA. Subject sections of interest: Precision measurements and metrology; Sensors and sensor systems; Signal processing.