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IOP Science

Semiconductor Science and Technology: 2020 Reviewer Awards

Neslihan Akcay, Baskent University, Turkey

Abhishek Chatterjee, Raja Ramanna Centre for Advanced Technology, India

Anna Ciechan, Polska Akademia Nauk Instytut Fizyki, Poland

J dos Santos, Universidade de Coimbra, Portugal

Michail (Michael) Exarchos, NEXPERIA Hamburg, Germany

Abdullah Goktas, Harran Universitesi, Turkey

Cesar Hernandez Vasquez, Instituto Politécnico Nacional, Mexico

Shinya Iwashita, ASM Microchemistry Ltd., Finland

Chun Hong Kang, King Abdullah University of Science and Technology, Saudi Arabia

Rosendo Lopez-Delgado, Universidad de Sonora, Mexico

Syed Major, Indian Institute of Technology Bombay, India

Victor Vainberg, Institute of Physics, Academy of sciences of Ukraine, Ukraine

Dominique Vignaud, IEMN – CNRS, France

Sake Wang, Tohoku University, Japan

Chao-Hsin Wu, National Taiwan University, Taiwan

Shaoqing Xiao, Jiangnan University, China

Shengjun Zhou, Wuhan University, China

Smart Materials and Structures: 2020 Reviewer Awards

Mohamed A A Abdelkareem, Wuhan University of Technology, China

Alessandro Airoldi, Politecnico di Milano, Italy

Mohammad Albakri, Virginia Polytechnic Institute and State University, United States

Huiliang Cao, Southeast University, China

Zurbiye Capku, Gebze Teknik Universitesi, Turkey

Xiang Cheng, Qian Xuesen Laboratory of Space Technology, China

David Coleman, Texas A&M University, United States

G N Dayananda, Council of Scientific & Industrial Research, India

Miroslav Frost, Czech Academy of Sciences, Czech Republic

Irina Garces, University of Alberta, Canada

Enrique García-Macías, University of Granada, Spain

Meng He, Huazhong University of Science and Technology, China

Zbigniew Kesy, Uniwersytet Technologiczno-Humanistyczny im Kazimierza Pulaskiego w Radomiu, Poland

Mohammad Javad Khodaei, Northeastern University, United States

Shailesh Kundalwal, Indian Institute of Technology Indore, India

Jiheng Li, University of Science and Technology Beijing, China

Yee Yan Lim, Southern Cross University, Australia

Hang Liu, Washington State University, United States

Rahman Mahdi, University of Technology , Iraq

Amin Mehrvarz, Northeastern University, United States

Andreas M Menzel, Otto von Guericke University Magdeburg, Germany

Mehrdad Negahban, University of Nebraska-Lincoln, United States of America

Yogita Parulekar, Bhabha Atomic Research Centre, India

Carlos Rossa, University of Ontario Institute of Technology, Canada

Mohsen Safaei, Georgia Institute of Technology, United States

Ethan Secor, Sandia Corporation, United States

Jan Suchorzewski, RISE Research Institutes of Sweden AB, Sweden

Prannoy Suraneni, University of Miami, United States

Tyler Tallman, Purdue University, United States

R Vila, Universitat Politecnica de Valencia, Spain

Fangxin Zou, The Hong Kong Polytechnic University, Hong Kong

Superconductor Science and Technology: 2020 Reviewer Awards

Reviewer of the Year: Tobias Habisreuther, Leibniz-Institut fur Photonische Technologien, Germany

 

Outstanding Reviewers

Giacomo Buccella, Politecnico di Milano, Italy

Krastyo Buchkov, Institut po fizika na tv’rdoto talo B’lgarska akademia na naukite, Bulgaria

Maria Chernykh, Nacional’nyj issledovatel’skij centr Kurcatovskij institut, Russian Federation

Marco Colangelo, Massachusetts Institute of Technology, United States of America

Alessandro Gaggero, Institute for Photonics and Nanotechnologies-CNR, Italy

Benjamin Parkinson, Victoria University of Wellington, New Zealand

Alexey Pavolotsky, Chalmers tekniska hogskola, Sweden

Charles Reece, Thomas Jefferson National Accelerator Facility, United States

Dimosthenis Stamopoulos, Ethniko Kentro Ereunas Physikon Epistemon Demokritos, Greece

Frederic Trillaud, Universidad Nacional Autonoma de Mexico, Mexico

Michel Van Camp, Royal Observatory of Belgium, Belgium

Surface Topography: Metrology and Properties : 2020 Reviewer Awards

Fabio Aarao Reis, Universidade Federal Fluminense, Brazil

Mohammad Alinezhadfar , Sahand University of Technology, Iran

Salil Bapat, Purdue University, United States

Chaobo Huang, Nanjing Forestry University, China

Dorothee Hüser, Physikalisch-Technische Bundesanstalt, Germany

Peng Jia, University of Jinan, China

G Lefebvre, Aperam Stainless Services and Solutions France, France

Narissara Mahathaninwong, Prince of Songkla University, Thailand

Falk Muench, Technical University of Darmstadt, Germany

Debashis Puhan, Imperial College London, United Kingdom

Jean-Michel Romano, University of Birmingham, United Kingdom

Marco Salerno, Istituto Italiano di Tecnologia, Italy

Sheikh Shahid Saleem, National Institute of Technology Srinagar , India

Yongang Zhang, Shandong University, China

Chinese Physics B: 2020 Reviewer Awards

Bocheng Bao, University of Changzhou, China

Jiming Bian, Dalian University of Technology, China

Xuebin Bian, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, China

Shimin Cai, University of Electronic Science and Technology of China, China

Shijian Cang, Tianjin University of Science and Technology, China

Juncheng Cao, Shanghai Institute of Microsystems and Information Technology, Chinese Academy of Sciences, China

Lixin Cao, Institute of Physics, Chinese Academy of Sciences, China

Hong Chang, National Time Service Center, Chinese Academy of Sciences, China

Shengjiang Chang, Nankai University   , China

Kai Chang, Institute of Semiconductors, Chinese Academy of Sciences, China

Ling Chen, Southwest University, China

Anmin Chen, Jilin University, China

Jing Chen,  Beijing Institute of Applied Physics and Computational Mathematics, China

Gang Chen, Chongqing University, China

Lin Chen, Huazhong University of Science and Technology, China

Daru Chen, Zhejiang Normal University, China

Gang Chen, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China

Jigen Chen, Taizhou University, China

Qili Chen, China University of Geosciences, China

Wei Chen, Tsinghua University, China

Yong Chen, Beihang University, China

Jianing Chen, Institute of Physics, Chinese Academy of Sciences, China

Zhihai Cheng, Renmin University of China, China

Ying Dai, Shandong University, China

Xiaobin Ding, Northwest Normal University, China

Lei Dong, Shanxi University, China

Shihai Dong, Instituto Politecnico Nacional, Mexico

Haifeng Dong, Beihang University, China

Zhenggao Dong, Southeast University, China

Shixuan Du, Institute of Physics, Chinese Academy of Sciences, China

Wei Fan, Hefei Institute of material science, Chinese Academy of Sciences, China

Engui Fan, Fudan University, China

Xiaoyong Fang, Yanshan University, China

Mang Feng, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, China

Shuangshuang Fu, University of Science and Technology Beijing, China

Guoying Gao, Huazhong University of Science and Technology, China

Kuiwei Geng, South China University of Technology, China

Huiyang Gou, Center for High Pressure Science & Technology Advanced Research, China

Yanfeng Guo, ShanghaiTech University, China

Yong Han, Sun Yat-Sen University, China

Zhibiao Hao, Tsinghua University, China

Dawei He, Beijing Jiaotong University, China

Zhibing He, China Academy of Engineering Physics, China

Liyun Hu, Jiangxi Normal University, China

Weida Hu, Shanghai Institute of Technical Physics, Chinese Academy of Sciences, China

Zhigao Hu, East China Normal University, China

Qian Huang, Nankai University   , China

Yongheng Huo, University of Science and Technology of China, China

Shunying Ji, Dalian University of Technology, China

Wei Ji, Renmin University of China, China

Xiaoqing Jiang, Zhejiang University, China

Jianhua Jiang, Soochow University, China

Nan Jiang, Tianjin University, China

Kui Jin, Institute of Physics, Chinese Academy of Sciences, China

Shiqi Jin, Shanghai Institute of Optical Precision Machinery, Chinese Academy of Sciences, China

Yanmei Kang, Xi’an Jiaotong University, China

Vladimir  Krsjak , Slovak University of Technology in Bratislava, Slovakia

Hua Kuang, Guangxi Normal University, China

Xuanyang Lai, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, China

Baowen Li, University of Colorado Boulder, United States

Chunbiao Li, Nanjing University of Information Science and Technology, China

Hui Li, Beijing Normal University, China

Jingyuan Li, Zhejiang University, China

Songlin Li, Nanjing University, China

Wei Li, Institute of Physics, Chinese Academy of Sciences, China

Wenfei Li, Nanjing University, China

Lei Liao, Hunan University, China

Zhimin Liao, Peking University, China

Linhan Lin, Tsinghua University, China

Liming Ling, South China University of Technology, China

Bo Liu, Tongji University, China

Feng Liu, Peking University, China

Jian Liu, Ningbo Institute of Materials Technology and Engineering, Chinese Academy of Sciences, China

Qi Liu, Fudan University, China

Shaoding Liu, Taiyuan University of Technology, China

Yang Liu, Sun Yat-Sen University, China

Yuxi Liu, Tsinghua University, China

Shibing Long, University of Science and Technology of China, China

Jianguo Lu, Zhejiang University, China

Junguang Lv, Institute of High Energy Physics, Chinese Academy of Sciences, China

Qingyu Ma,  Nanjing Normal University, China

Xiaohua Ma, Xidian University, China

Jun Ma, Lanzhou University of Technology, China

Xuanshi Meng, Northwestern Polytechnical University, China

Sheng Meng, Institute of Physics, Chinese Academy of Sciences, China

Zheng Peng, Central South University, China

Minghui Qin, South China Normal University, China

Ying Ren, Institute of Process Engineering, Chinese Academy of Sciences, China

Jun-jie Shi, Peking University, China

Jianwei Shuai, Xiamen University, China

Jie Song, Harbin Institute of Technology, China

Jiatao Sun, Beijing Institute of Technology, China

Liming Tang, Hunan University, China

Xin Tu, University of Liverpool, United Kingdom

Jin Wang, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, China

Chenghui Wang, Shaanxi Normal University, China

Lei Wang, Institute of Physics, Chinese Academy of Sciences, China

Zhigang Wang, Jilin University, China

Wenge Wang, University of Science and Technology of China, China

Haixing Wang, Beihang University, China

Ruzhi Wang,  Beijing University of Technology, China

Xiangbin Wang, Tsinghua University, China

Lianfu Wei, Southwest Jiaotong University, China

Jinhui Wu, Northeast Normal University, China

Huaqiang Wu, Tsinghua University, China

Yan Xia, Fuzhou University, China

Ruijuan Xiao, Institute of Physics, Chinese Academy of Sciences, China

Yanxia Xing, Beijing Institute of Technology, China

Yu Xue,  Guangxi University, China”

Longwen Yan, Southwestern Institute of Physics, China

Chuanlu Yang, Ludong University, China

Fan Yang, Beijing Institute of Technology, China

Minghui Yang, Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, China

Teng Yang, Institute of Metal Research, China

Yifeng Yang, Institute of Physics, Chinese Academy of Sciences, China

Mingcheng Yang, Institute of Physics, Chinese Academy of Sciences, China

Wei Yi, University of Science and Technology of China, China

Shun-Li Yu, Nanjing University, China

Ding Zhang, Tsinghua University, China

Weiwei Zhang, Max-Planck Institute for Science of Light, Germany

Jiazhong Zhang, Xi’an Jiaotong University, China

Yonggang Zhang, Shanghai Institute of Microsystems and Information Technology, Chinese Academy of Sciences, China

Yong Zhang, Harbin Institute of Technology, China

Jianwei Zhang, Tsinghua University, China

Wanrong Zhang, Beijing University of Technology, China

Jianhua Zhao, Institute of Semiconductors, Chinese Academy of Sciences, China

Zhigang Zheng, Huaqiao University, China

Peng Zhou, Fudan University, China

Xin Zhou, University of Chinese Academy of Sciences, China

Journal of Neural Engineering: 2020 Reviewer Awards

Jared Boasen, Tech3Lab, HEC Montréal, Canada

Denis Delisle-Rodriguez, Universidade Federal do Espirito Santo, Brazil

Strahinja Dosen, Aalborg Universitet, Denmark

Joel Frohlich, University of California, Los Angeles, United States

David Halliday, University of York, United Kingdom

Bryan Howell, Case Western Reserve University, United States

Zachary Irwin, University of Alabama at Birmingham, United States

Vinay Jayaram, Max-Planck-Institut für Intelligente Systeme, Germany

Hailong Liu, Dalian University of Technology, China

Michael Moffitt, Case Western Reserve University, United States

Andrés Salazar-Gómez, Boston University, United States

William Speier, University of California, Los Angeles, United States

Flavie Torrecillos, University of Oxford, United Kingdom

Tina Vrabec, MetroHealth Medical Center, United States

Christopher Wirth, The University of Sheffield, United Kingdom

Simeng Zhang, Abbott, United States

Journal of Micromechanics & Microengineering: 2020 Reviewer Awards

Khaled Aljasem, Z-Laser GmbH, Germany

Sandip Anasane, College of Engineering Pune (COEP), India

Thomas Buchheit, Sandia Corporation, United States

Yunqi Cao, California Southern University, United States of America

Subha Chakraborty, Point Surgical Inc., Canada

Marten Darmawan, Universitas Katolik Indonesia Atma Jaya, Indonesia

Karekin Esmeryan, Georgi Nadjakov Institute of Solid State Physics, Bulgaria

Valentina Furlan, Politecnico di Milano, Italy

David Huber, University of California, Santa Barbara, United States

Jeongmoo Huh, United Arab Emirates University, United Arab Emirates

Markus Kuehbach, Fritz Haber Institute of the Max Planck Society, Germany

Melinda Lake, The Ohio State University, United States

Pierre Lambert, Universite Libre de Bruxelles, Belgium

Joshua Lee, City University of Hong Kong, Hong Kong

Sebastian Linß, Technische Universitat Ilmenau, Germany

Junfeng Liu, National University of Defense Technology, China

A Ravi Sankar, Vellore Institute of Technology, Chennai, India

Robert Richards, Washington State University, United States

Jean-Michel Romano, University of Birmingham, United Kingdom

Raviraj Thakur, Oregon Health and Science University , United States

Roald Tiggelaar, MESA+ Institute, University of Twente, Netherlands

Georgiy Tkachenko, Okinawa Institute of Science and Technology Graduate University, Japan

Journal of Breath Research: 2020 Reviewer Awards

Sebastian Abegg, Eidgenossische Technische Hochschule Zurich, Switzerland

Paolo Cameli, Universita degli Studi di Siena, Italy

Isabelle Laleman, Katholieke Universiteit Leuven, Belgium

Meng Li, Harbin Medical University, China

Tommaso Lomonaco, Universita degli Studi di Pisa, Italy

James McCord, US Environmental Protection Agency, United States

Marta Rachel MD, PhD, Uniwersytet Rzeszowski , Poland

Phillip Trefz, Rostock University Medical Center, Germany

Michael Wilde, University of Leicester, United Kingdom

Japanese Journal of Applied Physics: 2020 Reviewer Awards

Reviewer of the Year: Seiya Kasai, Hokkaido University, Japan

 

Outstanding Reviewers

Xia Guo, Beijing University of Posts and Telecommunications, China

Jianjang Huang, National Taiwan University, Taiwan

Makoto Kasu, Saga University, Japan

Masashi Kato, Nagoya Institute of Technology, Japan

Takamasa Kawanago, Tokyo Institute of Technology, Japan

Naoki Kawano, Akita University, Japan

Mutsumi Kimura, Ryukoku University, Japan

Shin-Ichiro Kuroki, Hiroshima University, Japan

Takeo Maruyama, Kanazawa University, Japan

Tomoyuki Miyamoto, Tokyo Institute of Technology, Japan

Naotaka Nitta, National Institute of Advanced Industrial Science and Technology Tsukuba Center Tsukuba East, Japan

Jun-Seok Oh, Osaka City University, Japan

Susumu Okada, University of Tsukuba, Japan

Taizoh Sadoh, Kyushu University, Japan

Wataru Sakamoto, Chubu University, Japan

Kazunori Sato, Osaka University, Japan

Tetsuya Suemitsu, Tohoku University, Japan

Hirofumi Tanaka, Kyushu Kogyo Daigaku, Japan

Kaoru Toko, University of Tsukuba, Japan

Takayuki Yanagida, Nara Institute of Science and Technology, Japan

Kenji Yoshida, Chiba University, Japan

Inverse Problems: 2020 Reviewer Awards

Reviewer of the Year: James Webber, Tufts University, United States

 

Outstanding Reviewers

Selin Aslan, Argonne National Laboratory, United States

Tatiana Alessandra Bubba, University of Helsinki , Finland

Samuel Cogar, Rutgers University, United States

Aníbal Coronel, Universidad del Bío-Bío, Chile

Ludovic Métivier, CNRS, Univ. Grenoble Alpes, France

Wagner Muniz, Universidade Federal de Santa Catarina, Brazil

Mohamed Kamel RIAHI, Khalifa University, United Arab Emirates

Lassi Roininen, LUT University, Finland

Philipp Wacker, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Germany

Roland Wagner, Johannes Kepler Universitat Linz, Austria

Simon Weissmann, Universität Heidelberg, Germany