Semiconductor Science and Technology: 2017 Reviewer Awards

Reviewer of the Year: Professor Roland Van Meirhaeghe, Universiteit Gent, Belgium

Outstanding Reviewers

Dr Xinyu Bao, Stanford University, United States
Dr Stanislav Cichon, Institute of Chemical Technology, Czech Republic
Dr Adriano Cola, Consiglio Nazionale delle Ricerche, Italy
Professor Giovanni Crupi, Universita degli Studi di Messina, Italy
Professor Dr Xiao-Sheng Fang, Fudan University, China
Dr Eugenijus Gaubas, Vilnius University, Lithuania
Dr Zhen Guo, Suzhou Institute of Biomedical Engineering and Technology, Chinese Academy of Sciences, China
Dr Martin Hempel, Fraunhofer-Institut fur Zuverlassigkeit und Mikrointegration, Germany
Mr Jae Hur, Korea Advanced Institution of Science and Technology, Korea (the Republic of)
Dr Saumil Joshi, University of Massachusetts Amherst, United States
Dr Suwit Kiravittaya, Naresuan University, Thailand
Professor Kazuhiro Kudo, Chiba University, Japan
Mr Honglai Li, Hunan University, China
Professor Dr Xi Lin, Peking University, China
Professor Ming Liu, Chinese Academy of Sciences – Beijing, China
Dr Andrew Lohn, Sandia National Laboratories, United States
Dr Mohammad Najmzadeh, Intel Corporation, United States
Dr Erwin Peiner, TU Braunschweig, University of technology, Germany
Dr Roman Stoklas, IEE SAS, Slovakia
Dr Victor Vainberg, Institute of Physics, National Academy of Sciences of Ukraine, Ukraine
Professor Roland Van Meirhaeghe, Universiteit Gent, Belgium
Dr Zhengjun Wang, Georgia Institute of Technology, United States
Mr Gaoxue Wang, Michigan technological University, United States
Dr Mengye Wang, Hong Kong Polytechnical University, Hong Kong
Dr G Zoppi, Northumbria University, UK