Semiconductor Science and Technology: 2019 Reviewer Awards

Outstanding Reviewers

Professor Maurizio Acciarri, Università degli Studi di Milano-Bicocca, Italy
Professor Semsettin Altindal, Gazi Universitesi, Turkey
Dr Bülent Başol, Active Layer Parametrics, United States
Dr Pavel Brunkov, Ioffe Institute, Russian Federation
Professor Vladimir Chaldyshev, Ioffe Ioffe, Russian Federation
Professor Ting-Chang Chang, National Sun Yat-Sen University, Taiwan
Dr Shupeng Chen, Xidian University, China
Dr Nian Cheng, Xinyang Normal University, China
Professor Zengfeng Di, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, China
Dr Runchen Fang, Western Digital Corporation, United States
Associate Professor Hasan Huseyin Gullu, Atilim University, Turkey
Professor Gang He, Anhui University, China
Professor Jaewon Jang, Kyungpook National University, Korea
Professor Dr Dayong Jiang, Changchun University of Science and Technology, China
Professor Satyabrata Jit, Indian Institute of Technology Banaras Hindu University, India
Dr Mohammed Khaouani, Universite Abou Bekr Belkaid Tlemcen Faculte de Technologie, Algeria
Professor Garam Kim, Myongji University, Korea
Dr Robert Kudrawiec, Wroclaw University of Technology, Poland
Dr Jan Kuzmik, Slovak Academy of Sciences, Slovakia
Professor Wei Lan, Lanzhou University, China
Dr Xiangdong Li, IMEC, Belgium
Professor Saulius Marcinkevicius, KTh Royal Institute of Technology, Sweden
Professor Tung-Ming Pan, Chang Gung University, Taiwan
Professor Yongho Seo, Sejong University, Korea
Dr Ahmed Shaker, Ain Shams University, Egypt
Dr Wookyung Sun, Ewha Womans University, Korea
Dr Feng Teng, Northwest University, China
Dr Pengfei Tian, Fudan University, China
Professor Roland Van Meirhaeghe, Universiteit Gent, Belgium
Dr Chiu-Yen Wang, National Taiwan University of Science and Technology, Taiwan
Dr Wei Wang, Jilin University, China
Professor Chunxiang Xu, Southeast University, China
Dr Peng Zhao, Micron Technology Inc, United States