Semiconductor Science and Technology: 2018 Reviewer Awards
Outstanding reviewers
Professor Semsettin Altindal, Gazi Universitesi, Turkey
Dr Juan Paolo Bermundo, Nara Institute of Science and Technology, Japan
Dr Ayten Cantas, Pamukkale University, Turkey
Dr Umberto Celano, IMEC, Belgium
Dr Eun-Chel Cho, Hyundai Heavy Industry, Republic of Korea
Dr Daniel Chrastina, Politecnico di Milano, Italy
Dr Adriano Cola, Consiglio Nazionale delle Ricerche, Italy
Dr M Hadi Dastjerdi, Massachusetts Institute of Technology, United States
Dr Houqiang Fu, Arizona state university, United States
Professor Tomas Gonzalez, University of Salamanca, Spain
Dr Guo-Dong Hao, National Institute of Information and Communications Technology (NICT), Japan
Dr Weiguo Hu, Chinese Academy of Sciences, China
Dr Takamitsu Ishihara, Toshiba, Japan
Professor Ronald Knepper, Boston University, United States
Dr Lingyan Liang, Chinese Academy of Sciences – Ningbo Institute of Materials Technology and Engineering, China
Dr Chaoming Liu, Harbin Institute of Technology, China
Dr Roger Loo, IMEC, Belgium
Dr Haijun Lou, Peking University, China
Dr Xu Luo, Micron Technology Inc, United States
Professor Rodrigo Martins, Universidade Nova de Lisboa, Portugal
Dr Paolo Mele, Muroran Institute of Technology, Japan
Dr Pankaj Misra, Raja Ramanna Centre for Advanced Technology, India
Dr Francesco Montalenti, Universita degli Studi di Milano Bicocca, Italy
Professor Nenad Novkovski, St Cyril and Methodius University in Skopje, The Former Yugoslav Republic of Macedonia
Dr Reşit Özmenteş, Yuzuncu Yil Universitesi, Turkey
Professor Jea-Gun Park, Hanyang University, Republic of Korea
Dr Martti Puska, Aalto University, Finland
Professor Stefano Roddaro, University of Pisa, Italy
Dr Seung Ryu, Stanford University, United States
Professor Roland Van Meirhaeghe, Universiteit Gent, Belgium
Dr Andrei Vescan, Rheinisch – Westfalische Technische Hochschule Aachen, Germany
Dr Ye Wu, Louisiana State University, United States
Dr Donghai Wu, Northwestern University, United States
Dr Jianqi Xi, University of Wisconsin Madison, United States
Dr Xuejun Xu, Nippon Telegraph and Telephone Corporation, Japan
Dr Dawei Yan, Jiangnan University, China
Professor Dr Ercan Yılmaz, Abant İzzet Baysal Universty, Turkey
Dr Xizhen Zhang, Dalian Maritime University, China
Professor Dr Chuan-Zhen Zhao, Tianjin polytechnics university, China