Archives: Questions

Outstanding Reviewers

Professor Haiding Sun, University of Science and Technology of China, China
Professor Maojun Wang, Peking University, China
Professor Liaoyong Wen, Westlake University, China
Professor Yuantao Zhang, Jilin University, China
Professor Shibing Long, University of Science and Technology of China, China
Professor Daoyou Guo, Zhejiang Sci-Tech University, China
Professor Zhijie Wang, Institute of Semiconductors CAS, China
Professor Changtai Xia, Shanghai Institute of Optics and Fine Mechanics CAS, China
Professor Guangwei Xu, University of Science and Technology of China, China
Professor Jiandong Ye, Nanjing University, China

Outstanding Reviewers

Reviewer of the year: Professor Yvon Renotte, Universite de Liege, Belgium

Dr Atasi Dan, NIST Boulder Laboratories, United States of America
Dr Ellie Molloy, Callaghan Innovation Research and Technical Services Group, New Zealand
Dr Dalibor Ciprian, Vysoka skola banska-Technicka univerzita Ostrava, Czech Republic
Dr Andreas Erbe, Norges teknisk-naturvitenskapelige universitet, Norway
Dr Hai Lu, Henan Normal University, China
Dr Xiaosen Yang, Beijing Computational Science Research Center, China
Dr Jianming Wen, Kennesaw State University, United States of America
Mr Chunhui Li, Guilin University of Electronic Science and Technology, China
Dr Zhihan Zhu, Harbin University of Science and Technology, China
Dr Souvik Ghosh, University of Colorado Boulder, United States of America
Professor Shuo-Yen Tseng, National Cheng Kung University, Taiwan
Dr Fabrice Onofri, Aix-Marseille Universite, France

Outstanding Reviewers

Reviewers of the year:
Dr Guillermo Gallegos Ayala, Freie Universitat Berlin, Germany
Mr Jonatan Tidare, Malardalens universitet, Sweden
Dr Mohit Shivdasani, University of New South Wales, Australia

Dr Chris Beekman, Massachusetts General Hospital, United States of America
Dr Ismael Seanez, Washington University in St Louis, United States of America
Mr Luis Moctezuma, Benemerita Universidad Autonoma de Puebla, Mexico
Dr Aditya Joshi, University of Pennsylvania, United States of America
Dr David Brandman, Brown University, United States of America
Dr Alexandre Sayal, Coimbra Institute for Biomedical Imaging and Translational Research (CIBIT), Portugal
Mr Bradley Barth, Duke University, United States of America
Dr John Myers, Baylor College of Medicine, United States of America
Dr Chen Yang, Beijing University of Posts and Telecommunications, China
Mr T Schlichenmeyer, Washington University in St Louis, United States of America
Mr Jonatan Tidare, Malardalens universitet, Sweden
Dr Abdulwahab Alasfour, Kuwait University, Kuwait
Dr Hongwei Mao, University of Pittsburgh, United States of America
Mr Zexuan Hao, Tsinghua University, China
Dr Luca Mesin, Politecnico di Torino, Italy
Dr Roman Sandler, California Southern University, United States of America
Dr Richárd Fiáth, Termeszettudomanyi Kutatokozpont, Hungary
Ms Zaib Unnisa, Superior University, Pakistan
Mr Jordy Thielen, Radboud Universiteit, Netherlands
Dr Marco Bonizzato, Ecole Polytechnique Federale de Lausanne, Switzerland
Dr Jing Mu, The University of Melbourne, Australia
Mr Zheng Zhang, Imperial College London, United Kingdom
Dr Beth Lopour, University of California Irvine, United States of America
Professor Matthew Ward, Purdue University, United States of America
Dr Fatih Onay, Izmir Yuksek Teknoloji Enstitusu, Turkey
Professor Lee Miller, Northwestern University, United States of America
Dr Timothy Constandinou, Imperial College London, United Kingdom

Outstanding Reviewers

Dr Rebecca Taylor, Carnegie Mellon University, United States of America
Dr Davood Toghraie, Islamic Azad University Khomeini Shahr Branch, Iran (Islamic Republic of)
Dr José Mateus, Universidade do Porto, Portugal
Dr Nguyen Duy Vy, Truong Dai hoc Van Lang, Viet Nam
Ms Emilia Krok, Politechnika Poznanska, Poland
Dr Eduard Masvidal, Institut Catala de Nanociencia i Nanotecnologia, Spain
Dr Sukanta Nandi, Bar-Ilan University, Israel
Mr R Madhavan, Indian Institute of Science, India
Dr Kunitomo Kikuchi, Wakayama Daigaku, Japan
Ms Wanrong Xie, The University of North Carolina at Chapel Hill, United States of America
Dr Briliant Adhi Prabowo, Queen’s University Belfast, United Kingdom
Dr Shun Lu, South Dakota State University, United States of America
Dr Douglas Bopp, University of Colorado Boulder, United States of America
Dr Lijia Pan, Nanjing University, China
Professor Dr Lei Li, Nanjing University, China
Dr Anand Pal, Manipal Academy of Higher Education, India
Dr Wenheng Han, Lanzhou University, China
Dr Wenbo Peng, Xi’an Jiaotong University, China
Dr M Ravichandran, K Ramakrishnan College of Engineering, India
Dr Minghao Nie, Tokyo Daigaku, Japan
Dr Hongbo Zhu, Eastman Chemical Co, United States of America
Dr Chin Wei Lai, Universiti Malaya, Malaysia
Dr Eric Chappel, Debiotech SA, Switzerland
Dr Huiling Tai, University of Electronic Science and Technology of China, China
Professor Dr Xinqin Liao, Xiamen University, China
Dr Zaihua Duan, University of Electronic Science and Technology of China, China

Outstanding Reviewers

Reviewer of the year: Dr Kosuke Hara, University of Yamanashi, Japan

Dr Shoji Kakio, University of Yamanashi, Japan
Dr Kenji Ishikawa, Nagoya University, Japan
Dr Eisuke Tokumitsu, Japan Advanced Institute of Science and Technology, Japan
Dr Fumitaka Ohashi, Gifu University Faculty of Engineering Graduate School of Engineering, Japan
Dr Kazuki Tamura, Hamamatsu University School of Medicine, Japan
Professor Ken-ya Hashimoto, Chiba University, Japan
Dr Koh Johguchi, Shinshu University, Japan
Dr Mitsuru Sometani, National Institute of Advanced Industrial Science and Technology Tsukuba Center Tsukuba Central, Japan
Dr Nobutomo Nakamura, Osaka University, Japan
Dr Ryo Nagaoka, University of Toyama – Gofuku Campus, Japan
Professor Shinya Kumagai, Meijo University, Japan
Professor Dr Dmitry Migas, Belarusian State University of Informatics and Radioelectronics, Belarus
Professor Hyungjin Kim, Inha University, Korea (the Republic of)
Professor Dr Lang Zeng, Beihang University School of Microelectronics, China
Professor Man Hoi Wong, The Hong Kong University of Science and Technology, Hong Kong

Outstanding Reviewers

Professor John Greenman, University of the West of England, United Kingdom
Ms Kajsa Roslund, Helsingin yliopisto, Finland
Dr Giuseppe Fabio Parisi, Universita degli Studi di Catania, Italy
Dr Sara Gariglio, Universita degli Studi di Genova, Italy
Dr Kaisa Raninen, Ita-Suomen yliopisto, Finland
Professor Gus Hancock, University of Oxford, United Kingdom
Mr Robert van Vorstenbosch, Universiteit Maastricht, Netherlands
Dr Ethan McBride, Los Alamos National Laboratory, United States of America
Professor Dr Chris Mayhew, Universitat Innsbruck, Austria
Dr Lukas Müller-Wirtz, Universitatsklinikum des Saarlandes und Medizinische Fakultat der Universitat des Saarlandes, Germany

Outstanding Reviewers

Dr Oliver Dunbar, University of Warwick, United Kingdom
Professor Troy Butler, University of Colorado Denver, United States of America
Dr Frank Hettlich, Karlsruher Institut fur Technologie, Germany
Mr Daniel Obmann, Universitat Innsbruck, Austria
Dr Wojciech Ozanski, California Southern University, United States of America
Dr Oleh Melnyk, Technische Universität Berlin, Germany
Dr Zeljko Kereta, University College London, United Kingdom
Dr Thomas Humphries, University of Washington, United States of America
Professor Roland Herzog, Technische Universitat Chemnitz, Germany
Dr Silvia Gazzola, University of Bath, United Kingdom
Dr Javier Cebeiro, Universidad Nacional de San Martín, ITECA-CONICET, Argentina
Professor Dr Alemdar Hasanov, Kocaeli Universitesi, Turkey
Dr Philipp Wacker, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Germany
Professor Carlos Borges, University of Central Florida, United States of America

Outstanding Reviewers

Professor Qi Ge, Southern University of Science and Technology, China
Professor Jie Jiang, Central South University, China
Professor Guanhua Zhang, Hunan University, China
Professor Feng Jiang, Huaqiao University, China
Professor Mahdi Bodaghi, Nottingham Trent University, United Kingdom
Professor Kui Liu, Singapore Insitute of Manufacturing Technology, Singapore
Professor Yonglai Zhang, Jilin University, China
Professor Swee Leong Sing, National University of Singapore, Singapore
Professor Razvan Stoian, Hubert Curien Laboratory, France
Professor João Pedro Oliveira, Universidade NOVA de Lisboa, Portugal
Professor Xianfeng Shen, Institute of Machinery Manufacturing Technology, China Academy of Engineering Physics, China
Professor Wai Yee Yeong, Nanyang Technological University, Singapore
Professor Jeong Ho Cho, Yonsei University, Korea (the Republic of)
Professor Dae-Hyeong Kim, Seoul National University, Korea (the Republic of)
Professor Glen McHale, University of Edinburgh, United Kingdom

Outstanding Reviewers

Dr Zhengran He, The University of Alabama, United States of America
Mr Calum Noade, University of Windsor, Canada
Mr Hussain Ahmed, Allama Iqbal Open University, Pakistan
Dr P. K. Nair, Universidad Nacional Autonoma de Mexico, Mexico
Dr Juan Forero-Saboya, College de France, France
Dr Alexey Pavluchenko, Institut fiziki napivprovidnikiv imeni V E Laskar’ova Nacional’na akademia nauk Ukraini, Ukraine
Dr Arkadeep Mitra, The University of Texas at Dallas, United States of America
Dr Senol Mutlu, Bogazici Universitesi, Turkey
Dr Sonia Freddi, Universita Cattolica del Sacro Cuore, Italy
Mr Narasimman S, Missouri University of Science and Technology, United States of America
Mr Mirko Torres, Printability and Graphic Communications Institute, Canada
Dr Benjamin Allardyce, Deakin University, Australia
Dr Marco Alban-Paccha, University of Cambridge, United Kingdom
Professor Chin-Tai Chen, National Kaohsiung University of Science and Technology, Taiwan
Mr Anubhav Kumar, Raj Kumar Goel Institute of Technology & Management, India
Dr Xingzhong Guo, Zhejiang University, China
Dr Henrique Gomes, Universidade de Coimbra, Portugal
Dr Zaihua Duan, University of Electronic Science and Technology of China, China
Professor Gerd Grau, York University, Canada
Dr Yasuyuki Kusaka, Sangyo Gijutsu Sogo Kenkyujo Tsukuba, Japan
Dr Dimitris Barmpakos, Panepistemio Dytikes Attikes, Greece
Dr Giuseppe Arrabito, Universita degli Studi di Palermo, Italy
Mr Xiaomeng Liu, University of Massachusetts Amherst, United States of America
Mr Qian Zhang, Southeast University, China
Dr Mehta Sunita, Indian Institute of Technology Bombay, India
Dr Chloe Bois, Printability and Graphic Communications Institute, Canada

Outstanding Reviewers

Dr B A Haider, Kyungpook National University College of Engineering, Korea (the Republic of)
Dr Kishalay Mitra, Indian Institute of Technology (IIT) – Hyderabad, India
Dr Awanish Pratap Singh, University of Lübeck, Germany
Professor Chaoqun Liu, Univ. of Texas at Arlington, United States