Metrologia: 2019 Reviewer Awards

Outstanding Reviewers

Dr Antonio Possolo, National Institute of Standards and Technology, United States
Dr Paul Quincey, National Physical Laboratory, United Kingdom
Dr Andrew Rukhin, National Institute of Standards and Technology, United States
Dr Adriaan van der Veen, VSL – Dutch Metrology Institute, Netherlands
Dr Dong-Hoon Lee, Korea Research Institute of Standards and Science, Republic of Korea
Dr Joanne Zwinkels, National Research Council of Canada – Ottawa, Canada
Dr Yun-Jhih Chen, NIST, United States
Dr Han Haitjema, Mitutoyo Research Centre Europe, Netherlands
Dr Akobuije Chijioke, National Institute of Standards and Technology, United States
Mr Emile Webster, Callaghan Innovation, New Zealand
Dr Gerd Wuebbeler, Physikalisch – Technische Bundesanstalt, Germany
Dr Marco Di Luzio, Istituto Nazionale di Ricerca Metrologica, Italy
Dr Peter Saunders, Callaghan Innovation, New Zealand