Measurement Science and Technology: Outstanding Reviewer Awards 2023
Outstanding Reviewers
Dr Jeffrey Eldridge, NASA, United States of America
Dr Thomas Caswell, Brookhaven National Laboratory, United States of America
Dr Daehun Kang, Mayo Foundation for Medical Education and Research, United States of America
Dr Andreas Wieser, Eidgenossische Technische Hochschule Zurich, Switzerland
Dr Andrea Paul, Bundesanstalt fur Materialforschung und -prufung, Germany
Dr Eemu-Samuli Väliaho, Ita-Suomen yliopisto, Finland
Professor Michal Wieczorowski, Politechnika Poznanska, Poland
Dr Yamin Sayyari, Shahid Bahonar University of Kerman, Iran (Islamic Republic of)
Mr Wenbo Zhang, Lanzhou University of Technology, China
Dr Gema Prats-Boluda, Universitat Politecnica de Valencia, Spain
Mr Nitin Lautre, Visvesvaraya Technological University, India
Dr Cecilia Vale, Universidade do Porto, Portugal
Dr Hannaneh Mahdavi, University of Central Florida, United States of America
Dr Peter Muller, Villanova University, United States of America
Dr Xing Huang, Nanjing University of Information Science and Technology, China
Dr Sergiy Svitlov, T-Online International AG, Germany
Mr Markus Schake, Physikalisch-Technische Bundesanstalt, Germany
Dr Vijayprasath Sethuraman, PSNA College of Engineering and Technology, India
Dr Shenqing Xiao, Harbin Institute of Technology, China
Miss Solmaz Aliyeva, Azerbaijan State Oil and Industry University, Azerbaijan
Professor Donald Bailey, Massey University, New Zealand
Dr Daniel O’Connor, National Physical Laboratory, United Kingdom
Dr Shin Yee Khoo, Universiti Malaya, Malaysia
Dr Fabrice Onofri, Aix-Marseille Universite, France
Dr Quan Zhang, Nankai University, China
Dr Xuefang Xu, Yanshan University, China
Dr Xinxin Li, Guangxi University, China
Dr Stefano Petro, Politecnico di Milano, Italy
Dr Varun Gupta, Krishna Institute of Engineering and Technology, India
Dr Shen Shou Chung, National Yang Ming Chiao Tung University, Taiwan
Dr Tsubasa Ikami, Tohoku Daigaku, Japan
Dr Maggie Delano, Swarthmore College, United States of America
Mr Valerio Formichella, Istituto Nazionale di Ricerca Metrologica, Italy
Professor Dr Yasuhiro Egami, Aichi Kogyo Daigaku, Japan
Dr Gang Li, Southwest Petroleum University, China
Mr Zhou Yao, Henan University of Science and Technology, China
Mr Yiyang Liu, Dalian Jiaotong University, China
Dr Kai Zhou, Michigan Technological University, United States of America
Mr Limu Qin, Southwest Jiaotong University, China
Dr Ngai Kwok, Western Sydney University, Australia
Professor Weilian Wang, Yunnan University, China
Dr Rajesh Mahadeva, Indian Institute of Technology Roorkee, India
Dr Hui Zhang, Shanghai University of Engineering Science, China
Dr Quan Qian, Chongqing University, China
Dr Wei Guo, University of Electronic Science and Technology of China, China
Dr Shudong Ou, Xi’an Jiaotong University, China
Dr Junyu Guo,Southwest Petroleum University, China
Dr Xu Zheng, Zhejiang University, China
Dr Qiang Guo, New York Stem Cell Foundation, United States of America
Dr Daoming She, Southeast University, China
Dr Yongjian Li, Southwest Jiaotong University, China
Professor Yiping Shen, Hunan University of Science and Technology, China
Dr Sai Li, Wuhan Institute of Technology, China
Mr Qian Zhang, Guangxi University, China
Mr Xiaofei Xu China University of Petroleum East China, China
Mr Heng Gu, Jiangsu Normal University, China
Mr Tao Gong, China University of Mining and Technology, China
Dr Zhilin Dong, Beijing University of Technology, China
Professor Qing Zhang, Tongji University, China
Dr Zhou Jianghong, Chongqing University, China
Dr Yun Ke, Harbin, Engineering University, China
Dr Xiaoan Yan, Southeast University, China
Mr Jian Tang, Chongqing University, China
Professor Dr Jing Liu, Northwestern Polytechnical University, China
Dr Zhenya Wang, Fuzhou University, China
Dr Chao Wang, Harbin Institute of Technology, China
Dr Guowei Zhang, Xidian University, China
Dr Te Han, Beijing Institute of Technology, China
Dr Arunabha Mohan Roy, University of Michigan, United States of America
Mr Kai Luo, University of Electronic Science and Technology of China, China
Mr Yuqi Cheng, Huazhong University of Science and Technology, China
Mr Changchang Che, Nanjing Forestry University, China
Dr Li Lin, Dalian Jiaotong University, China
Dr Xudong Song, Dalian Jiaotong University, China
Dr Xuhang Liu, Northwestern Polytechnical University, China
Dr Yuyan Zhang, Huazhong University of Science and Technology, China
Dr Wenchang Zhu, Nantong University, China
Dr Kai Zheng, Chongqing University of Posts and Telecommunications, China
Mr Zhehao Li, Taiyuan University of Science and Technology, China
Dr Chuancang Ding, Xi’an Jiaotong University, China
Professor Ke Feng, The University of British Columbia, Canada
Mr Xin Wang, Northwestern Polytechnical University, China
Dr Wentao Zhao, Inner Mongolia University of Science and Technology, China
Dr Ji Tan, Guangdong University of Technology, China
Miss Mengjie Zeng, Nanjing University of Aeronautics and Astronautics, China
Dr Zengkun Wang, Chang’an University, China
Dr Zijian Qiao, Lanzhou University of Technology, China
Dr Saleem Riaz, Northwestern Polytechnical University, China
Dr Jiashuo Shi, Huazhong University of Science and Technology, China
Dr Kangping Gao, Chang’an University, China
Mr Jianqun Zhang, Tongji University, China