Measurement Science and Technology: 2016 Reviewer Awards

Reviewer of the Year: Dr Jože Kutin, University of Ljubljana, Faculty of Mechanical Engineering, Slovenia

Working in fluid flow and pressure metrology—subjects that are also a feature of Measurement Science and Technology—Dr Jože Kutin will accept an invitation to referee if the paper corresponds to his field of expertise, interest and ability to meet the review schedule.

When reviewing, Dr Kutin looks for the paper’s central idea and whether it takes into account already-available findings in the scientific literature. He lays stress upon the correctness of the research methodology and the results, as well as clarity in the presentation.

According to Dr Kutin, refereeing is a form of cooperation between researchers; and, as a reviewer, he feels he is contributing to the quality of presented scientific papers and, consequently, to a positive development of his research field.

Overall, Dr Kutin believes that the current peer-review process is good in journals with editorial advisory boards and structured reviewer databases comprising highly qualified professionals. It is important that papers are reviewed by experts, he says, who are able to provide a critical judgement about the authors’ research contribution.

His advice to first-time reviewers is to bear in mind that remarks should be clearly argued and supported by objective evidence. In this way, authors will be more amenable to making corrections, increasing the likelihood of valuable discussions.

Outstanding Reviewers:

Professor Massimiliano Avalle, Politecnico di Torino, Italy
Dr M Bakker, Technische Universiteit Delft, Netherlands
Mr Qingzhong Cai, Beihang University, China
Dr Ayan Chakrabarty, NASA Jet Propulsion Laboratory, United States
Dr Valeri Chikovani, Natsional’nij aviatsiynyi universitet, Ukraine
Dr Sejong Chun, Korea Research Institute of Standards and Science, Republic of Korea
Dr Mark Clarkson, Callaghan Innovation, New Zealand
Dr Moises Cywiak, Centro de Investigaciones Opticas, Mexico
Professor Paulo de Brito Andre, Universidade de Aveiro, Portugal
Professor Richard Dewhurst, The University of Manchester, UK
Dr G Dimitrakis, University of Nottingham, UK
Dr Gerrit Elsinga, Technische Universiteit Delft, Netherlands
Dr Ruimin Feng, Southern Illinois University Carbondale, United States
Dr Noriyuki Furuichi, National Institute of Advanced Industrial Science and Technology, National Metrology Institute of Japan, Japan
Professor Patrick Gane, Omya AG, Switzerland
Professor John Girkin, Durham University, UK
Dr Adam Glowacz, Akademia Gorniczo-Hutnicza im Stanislawa Staszica w Krakowie, Poland
Dr Gregor Goett, Leibniz Institut fuer Plasmaforschung und Technologie, Germany
Dr Rainer Hain, Universitat der Bundeswehr Munchen, Germany
Dr Han Haitjema, Mitutoyo Research Centre Europe, Netherlands
Dr Peter Harris, National Physical Laboratory, UK
Dr Kenichi Hibino, National Institute of Advanced Industrial Science and Technology Ibaraki, Japan
Dr Udo Kaatze, Universitaet Goettingen, Germany
Mr Hyoungsoo Kim, Princeton University, United States
Dr Ludger Koenders, Physikalisch – Technische Bundesanstalt, Germany
Professor D Koon, St Lawrence University, United States
Dr R Koops, VSL Dutch Metrology Institute, Netherlands
Dr Christine Kranz, Universitaet Ulm, Germany
Dr Nicolas Lammens, UGent, Belgium
Professor Sang Joon Lee, Pohang University of Science and Technology, Republic of Korea
Dr Xiang Li, Xidian University, China
Dr Xianming Liu, Chongqing University, China
Dr Guigen Liu, University of Nebraska-Lincoln, United States
Dr Jiazhen Lu, Beijing University of Aeronautics and Astronautics, China
Dr Andrew Malcolm, Singapore Institute of Manufacturing Technology, Singapore
Dr A Martinez Olmos, Universidad de Granada, Spain
Dr Jimmie Miller, The University of North Carolina at Charlotte, United States
Dr M Mohd Noor, The University of New South Wales, Australia
Dr Arden Moore, Louisiana Tech University, United States
Dr Jody Muelaner, University of Bath, UK
Professor Dr Yuichi Murai, Hokkaido University, Japan
Dr Tuck Ng, Monash University, Australia
Dr Roberto Olmi, CNR – Istituto di Fisica Applicata ‘Nello Carrara’, Italy
Professor Chansik Park, Chungbuk National University, Republic of Korea
Professor Lihui Peng, Tsinghua University, China
Dr Stefan Persijn, VSL, Netherlands
Dr Steven Phillips, National Institute of Standards and Technology, United States
Dr Primoz Podrzaj, University of Ljubljana, Slovenia
Dr Igor Prikhodko, Analog Device Inc., United States
Professor Agustin Salazar, Universidad del Pais Vasco – Euskal Herriko Unibertsitatea, Spain
Dr Silvia María Satorres Martínez, University of Jaen, Spain
Dr Frank Scholze, Physikalisch – Technische Bundesanstalt, Germany
Dr Liang Shu, Wenzhou University, China
Dr Joel Silver, Southwest Sciences Inc., United States
Professor Allan Spence, McMaster University, Canada
Professor Jo Spronck, Technische Universiteit Delft, Netherlands
Dr Alexandr Stupakov, Institute of Physics ASCR, Czech Republic
Dr Yang Su, PLA University of Science and Technology, China
Dr Osamu Terashima, Toyama Prefectural University, Japan
Dr M van Veghel, VSL, Netherlands
Dr Dong Wang, City University of Hong Kong, China
Dr Peng Wang, Tianjin University, China
Professor Fei Wang, Southern University of Science and Technology, China
Mr Xiaoyi Wang, Beijing University of Technology, China
Professor Mi Wang, University of Leeds, UK
Dr William Wang, University of Sussex, UK
Dr Xin Wang, Northwestern University, United States
Dr Richard Whalley, Newcastle University, UK
Professor Michal Wieczorowski, Poznan University of Technology, Poland
Mr B Wieneke, LaVision GmbH, Germany
Dr Cheng Xie, Schlumberger Cambridge Research Centre, UK
Professor Dr Guan Xu, Jilin University, China
Dr Hua Yan, Shenyang University of Technology, China
Dr Wang yanqing, Chinese Academy of Sciences, Academy of Opto-electronics, China
Dr Wuliang Yin, The University of Manchester, UK
Professor Bernhard Zagar, Johannes-Kepler-Universitat Linz, Austria
Dr Yinan Zhang, Lumentum, United States